Binod Kumar, Ankit Jindal, Virendra Singh. A trace signal selection algorithm for improved post-silicon debug. In 2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{KumarJS16-0,
title = {A trace signal selection algorithm for improved post-silicon debug},
author = {Binod Kumar and Ankit Jindal and Virendra Singh},
year = {2016},
doi = {10.1109/EWDTS.2016.7807700},
url = {http://dx.doi.org/10.1109/EWDTS.2016.7807700},
researchr = {https://researchr.org/publication/KumarJS16-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016},
publisher = {IEEE},
isbn = {978-1-5090-0693-9},
}