Texture inspection for defects using neural networks and support vector machines

Ajay Kumar, Helen C. Shen. Texture inspection for defects using neural networks and support vector machines. In ICIP (1). pages 353-356, 2002.

Authors

Ajay Kumar

This author has not been identified. Look up 'Ajay Kumar' in Google

Helen C. Shen

This author has not been identified. Look up 'Helen C. Shen' in Google