Probabilistic model for nanocell reliability evaluation in presence of transient errors

Renu Kumawat, Vineet Sahula, Manoj Singh Gaur. Probabilistic model for nanocell reliability evaluation in presence of transient errors. IET Computers & Digital Techniques, 9(4):213-220, 2015. [doi]

Authors

Renu Kumawat

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Vineet Sahula

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Manoj Singh Gaur

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