Improving student performance using automated testing of simulated digital logic circuits

Zachary Kurmas. Improving student performance using automated testing of simulated digital logic circuits. In June Amillo, Cary Laxer, Ernestina Menasalvas Ruiz, Alison Young, editors, Proceedings of the 13th Annual SIGCSE Conference on Innovation and Technology in Computer Science Education, ITiCSE 2008, Madrid, Spain, June 30 - July 2, 2008. pages 265-270, ACM, 2008. [doi]

@inproceedings{Kurmas08,
  title = {Improving student performance using automated testing of simulated digital logic circuits},
  author = {Zachary Kurmas},
  year = {2008},
  doi = {10.1145/1384271.1384342},
  url = {http://doi.acm.org/10.1145/1384271.1384342},
  tags = {testing, logic},
  researchr = {https://researchr.org/publication/Kurmas08},
  cites = {0},
  citedby = {0},
  pages = {265-270},
  booktitle = {Proceedings of the 13th Annual SIGCSE Conference on Innovation and Technology in Computer Science Education, ITiCSE 2008, Madrid, Spain, June 30 - July 2, 2008},
  editor = {June Amillo and Cary Laxer and Ernestina Menasalvas Ruiz and Alison Young},
  publisher = {ACM},
  isbn = {978-1-60558-078-4},
}