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Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing

Daniel Kurz, Horst Lewitschnig, Jürgen Pilz. Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing. In Stephen J. Buckley, John A. Miller, editors, Proceedings of the 2014 Winter Simulation Conference, Savannah, GA, USA, December 7-10, 2014. pages 2600-2608, IEEE/ACM, 2014. [doi]

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Daniel Kurz

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Horst Lewitschnig

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Jürgen Pilz

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