Lifetime maximization under reliability constraint via cross-layer strategy in wireless sensor networks

Hojoong Kwon, Tae-Hyun Kim, Sunghyun Choi, Byeong Gi Lee. Lifetime maximization under reliability constraint via cross-layer strategy in wireless sensor networks. In IEEE Wireless Communications and Networking Conference, WCNC 2005, March 13-17, 2005, New Orleans, Louisiana, USA. pages 1891-1896, IEEE, 2005. [doi]

Authors

Hojoong Kwon

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Tae-Hyun Kim

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Sunghyun Choi

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Byeong Gi Lee

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