A Robust Area-Efficient Physically Unclonable Function With High Machine Learning Attack Resilience in 28-nm CMOS

You-Cheng Lai, Chun-Yen Yao, Shao-Hong Yang, Ying-Wei Wu, Tsung-Te Liu. A Robust Area-Efficient Physically Unclonable Function With High Machine Learning Attack Resilience in 28-nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap., 69(1):347-355, 2022. [doi]

@article{LaiYYWL22,
  title = {A Robust Area-Efficient Physically Unclonable Function With High Machine Learning Attack Resilience in 28-nm CMOS},
  author = {You-Cheng Lai and Chun-Yen Yao and Shao-Hong Yang and Ying-Wei Wu and Tsung-Te Liu},
  year = {2022},
  doi = {10.1109/TCSI.2021.3098018},
  url = {https://doi.org/10.1109/TCSI.2021.3098018},
  researchr = {https://researchr.org/publication/LaiYYWL22},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Circuits Syst. I Regul. Pap.},
  volume = {69},
  number = {1},
  pages = {347-355},
}