Jean-Charles Lamirel. Enhancing Classification Accuracy with the Help of Feature Maximization Metric. In 2013 IEEE 25th International Conference on Tools with Artificial Intelligence, Herndon, VA, USA, November 4-6, 2013. pages 569-574, IEEE, 2013. [doi]
@inproceedings{Lamirel13-0,
title = {Enhancing Classification Accuracy with the Help of Feature Maximization Metric},
author = {Jean-Charles Lamirel},
year = {2013},
doi = {10.1109/ICTAI.2013.90},
url = {http://dx.doi.org/10.1109/ICTAI.2013.90},
researchr = {https://researchr.org/publication/Lamirel13-0},
cites = {0},
citedby = {0},
pages = {569-574},
booktitle = {2013 IEEE 25th International Conference on Tools with Artificial Intelligence, Herndon, VA, USA, November 4-6, 2013},
publisher = {IEEE},
}