Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing

Leon Lantz, Seongdeok Hwang, Michael G. Pecht. Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing. Microelectronics Reliability, 42(8):1163-1170, 2002. [doi]

Authors

Leon Lantz

This author has not been identified. Look up 'Leon Lantz' in Google

Seongdeok Hwang

This author has not been identified. Look up 'Seongdeok Hwang' in Google

Michael G. Pecht

This author has not been identified. Look up 'Michael G. Pecht' in Google