Impact of interconnect length changes on effective materials properties (dielectric constant) - researchr publication authors

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Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand. Impact of interconnect length changes on effective materials properties (dielectric constant). In Andrew A. Kennings, Ion I. Mandoiu, editors, The Ninth International Workshop on System-Level Interconnect Prediction (SLIP 2007), Austin, Texas, USA, March 17-18, 2007, Proceedings. pages 73-80, ACM, 2007. [doi]

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