Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits

Piotr Laskowski, Arkadiusz Glowacki, Christian Boit. Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. Microelectronics Reliability, 48(8-9):1295-1299, 2008. [doi]

@article{LaskowskiGB08,
  title = {Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits},
  author = {Piotr Laskowski and Arkadiusz Glowacki and Christian Boit},
  year = {2008},
  doi = {10.1016/j.microrel.2008.07.014},
  url = {http://dx.doi.org/10.1016/j.microrel.2008.07.014},
  researchr = {https://researchr.org/publication/LaskowskiGB08},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {48},
  number = {8-9},
  pages = {1295-1299},
}