Deep specification mining

Tien-Duy B. Le, David Lo 0001. Deep specification mining. In Frank Tip, Eric Bodden, editors, Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018. pages 106-117, ACM, 2018. [doi]

Authors

Tien-Duy B. Le

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David Lo 0001

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