Tien-Duy B. Le, David Lo, Claire Le Goues, Lars Grunske. A learning-to-rank based fault localization approach using likely invariants. In Andreas Zeller, Abhik Roychoudhury, editors, Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrücken, Germany, July 18-20, 2016. pages 177-188, ACM, 2016. [doi]
@inproceedings{LeLGG16,
title = {A learning-to-rank based fault localization approach using likely invariants},
author = {Tien-Duy B. Le and David Lo and Claire Le Goues and Lars Grunske},
year = {2016},
doi = {10.1145/2931037.2931049},
url = {http://doi.acm.org/10.1145/2931037.2931049},
researchr = {https://researchr.org/publication/LeLGG16},
cites = {0},
citedby = {0},
pages = {177-188},
booktitle = {Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrücken, Germany, July 18-20, 2016},
editor = {Andreas Zeller and Abhik Roychoudhury},
publisher = {ACM},
isbn = {978-1-4503-4390-9},
}