David Lechevalier, Steven Hudak, Ronay Ak, Y. Tina Lee, Sebti Foufou. A neural network meta-model and its application for manufacturing. In 2015 IEEE International Conference on Big Data, Big Data 2015, Santa Clara, CA, USA, October 29 - November 1, 2015. pages 1428-1435, IEEE, 2015. [doi]