Pei-Chun Lee. Investigating the Knowledge Spillover and Externality of Technology Standards Based on Patent Data. IEEE Trans. Engineering Management, 68(4):1027-1041, 2021. [doi]
@article{Lee21-28,
title = {Investigating the Knowledge Spillover and Externality of Technology Standards Based on Patent Data},
author = {Pei-Chun Lee},
year = {2021},
doi = {10.1109/TEM.2019.2911636},
url = {https://doi.org/10.1109/TEM.2019.2911636},
researchr = {https://researchr.org/publication/Lee21-28},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Engineering Management},
volume = {68},
number = {4},
pages = {1027-1041},
}