Sungwon Lee, KwangEun An, Byung Don Jeon, Kyoung Yeon Cho, Seung Jae Lee, Dongmahn Seo. Detecting faulty solar panels based on thermal image processing. In IEEE International Conference on Consumer Electronics, ICCE 2018, Las Vegas, NV, USA, January 12-14, 2018. pages 1-2, IEEE, 2018. [doi]
@inproceedings{LeeAJCLS18,
title = {Detecting faulty solar panels based on thermal image processing},
author = {Sungwon Lee and KwangEun An and Byung Don Jeon and Kyoung Yeon Cho and Seung Jae Lee and Dongmahn Seo},
year = {2018},
doi = {10.1109/ICCE.2018.8326228},
url = {https://doi.org/10.1109/ICCE.2018.8326228},
researchr = {https://researchr.org/publication/LeeAJCLS18},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2018, Las Vegas, NV, USA, January 12-14, 2018},
publisher = {IEEE},
isbn = {978-1-5386-3025-9},
}