Hosung Lee, Sanghyeon Baeg. Signal characteristic and test exploitation for intermittent nanometer-scale cracks. Microelectronics Reliability, 84:26-36, 2018. [doi]
@article{LeeB18-0,
title = {Signal characteristic and test exploitation for intermittent nanometer-scale cracks},
author = {Hosung Lee and Sanghyeon Baeg},
year = {2018},
doi = {10.1016/j.microrel.2018.03.001},
url = {https://doi.org/10.1016/j.microrel.2018.03.001},
researchr = {https://researchr.org/publication/LeeB18-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {84},
pages = {26-36},
}