Electrical Defect Imaging of ITO Coated Glass by Optical Microscope With Microwave Heating

Hanju Lee, Zhirayr Baghdasaryan, Barry Friedman, Kiejin Lee. Electrical Defect Imaging of ITO Coated Glass by Optical Microscope With Microwave Heating. IEEE Access, 7:42201-42209, 2019. [doi]

Authors

Hanju Lee

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Zhirayr Baghdasaryan

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Barry Friedman

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Kiejin Lee

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