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Advanced uncertainty based approach for discovering erasable product patterns

Chanhee Lee, Yoonji Baek, Jerry Chun-Wei Lin, Tin C. Truong, Unil Yun. Advanced uncertainty based approach for discovering erasable product patterns. Knowl.-Based Syst., 241:108134, 2022. [doi]

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Chanhee Lee

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Yoonji Baek

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Jerry Chun-Wei Lin

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Tin C. Truong

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Unil Yun

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