Defect Imaging Enhancement through Optimized Shape Factors of the RAPID Algorithm Based on Guided Wave Beam Pattern Analysis

Yonghee Lee, Younho Cho. Defect Imaging Enhancement through Optimized Shape Factors of the RAPID Algorithm Based on Guided Wave Beam Pattern Analysis. Sensors, 21(11):4029, 2021. [doi]

Authors

Yonghee Lee

This author has not been identified. Look up 'Yonghee Lee' in Google

Younho Cho

This author has not been identified. Look up 'Younho Cho' in Google