C. S. Lee, C.-H. Choi, J. Y. Choi, Y. K. Kim, S. H. Choi. Feature extraction algorithm based on adaptive wavelet packet for surface defect classification. In ICIP (2). pages 673-676, 1996. [doi]
@inproceedings{LeeCCKC96,
title = {Feature extraction algorithm based on adaptive wavelet packet for surface defect classification},
author = {C. S. Lee and C.-H. Choi and J. Y. Choi and Y. K. Kim and S. H. Choi},
year = {1996},
doi = {10.1109/ICIP.1996.560968},
url = {http://doi.ieeecomputersociety.org/10.1109/ICIP.1996.560968},
researchr = {https://researchr.org/publication/LeeCCKC96},
cites = {0},
citedby = {0},
pages = {673-676},
booktitle = {ICIP (2)},
}