Semi-GAN: An Improved GAN-Based Missing Data Imputation Method for the Semiconductor Industry

Sun Yong Lee, Timothy Paul Connerton, Yeon-Woo Lee, Daeyoung Kim, Donghwan Kim, Jin-Ho Kim. Semi-GAN: An Improved GAN-Based Missing Data Imputation Method for the Semiconductor Industry. IEEE Access, 10:72328-72338, 2022. [doi]

@article{LeeCLKKK22,
  title = {Semi-GAN: An Improved GAN-Based Missing Data Imputation Method for the Semiconductor Industry},
  author = {Sun Yong Lee and Timothy Paul Connerton and Yeon-Woo Lee and Daeyoung Kim and Donghwan Kim and Jin-Ho Kim},
  year = {2022},
  doi = {10.1109/ACCESS.2022.3188871},
  url = {https://doi.org/10.1109/ACCESS.2022.3188871},
  researchr = {https://researchr.org/publication/LeeCLKKK22},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {10},
  pages = {72328-72338},
}