Pei-Chun Lee, Ssu-Hua Chen, Yi-Siang Lin, Hsin-Ning Su. Toward a Better Understanding on Technological Resilience for Sustaining Industrial Development. IEEE Trans. Engineering Management, 66(3):398-411, 2019. [doi]
@article{LeeCLS19,
title = {Toward a Better Understanding on Technological Resilience for Sustaining Industrial Development},
author = {Pei-Chun Lee and Ssu-Hua Chen and Yi-Siang Lin and Hsin-Ning Su},
year = {2019},
doi = {10.1109/TEM.2018.2837221},
url = {https://doi.org/10.1109/TEM.2018.2837221},
researchr = {https://researchr.org/publication/LeeCLS19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Engineering Management},
volume = {66},
number = {3},
pages = {398-411},
}