Ke-Jing Lee, Yu-Chi Chang, Cheng-Jung Lee, Li-wen Wang, Yeong-Her Wang. Resistive switching properties of alkaline earth oxide-based memory devices. Microelectronics Reliability, 83:281-285, 2018. [doi]
@article{LeeCLWW18,
title = {Resistive switching properties of alkaline earth oxide-based memory devices},
author = {Ke-Jing Lee and Yu-Chi Chang and Cheng-Jung Lee and Li-wen Wang and Yeong-Her Wang},
year = {2018},
doi = {10.1016/j.microrel.2017.06.080},
url = {https://doi.org/10.1016/j.microrel.2017.06.080},
researchr = {https://researchr.org/publication/LeeCLWW18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {83},
pages = {281-285},
}