PatchMatch-RL: Deep MVS with Pixelwise Depth, Normal, and Visibility

Jae-Yong Lee, Joseph DeGol, Chuhang Zou, Derek Hoiem. PatchMatch-RL: Deep MVS with Pixelwise Depth, Normal, and Visibility. In 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021. pages 6138-6147, IEEE, 2021. [doi]

Authors

Jae-Yong Lee

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Joseph DeGol

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Chuhang Zou

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Derek Hoiem

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