Recognizing yield patterns through hybrid applications of machine learning techniques

Jang Hee Lee, Sung Ho Ha. Recognizing yield patterns through hybrid applications of machine learning techniques. Inf. Sci., 179(6):844-850, 2009. [doi]

@article{LeeH09:0,
  title = {Recognizing yield patterns through hybrid applications of machine learning techniques},
  author = {Jang Hee Lee and Sung Ho Ha},
  year = {2009},
  doi = {10.1016/j.ins.2008.11.008},
  url = {http://dx.doi.org/10.1016/j.ins.2008.11.008},
  tags = {machine learning},
  researchr = {https://researchr.org/publication/LeeH09%3A0},
  cites = {0},
  citedby = {0},
  journal = {Inf. Sci.},
  volume = {179},
  number = {6},
  pages = {844-850},
}