Yu-Min Lee, Pei-Yu Huang. An efficient method for analyzing on-chip thermal reliability considering process variations. ACM Trans. Design Autom. Electr. Syst., 18(3):41, 2013. [doi]
@article{LeeH13-8,
title = {An efficient method for analyzing on-chip thermal reliability considering process variations},
author = {Yu-Min Lee and Pei-Yu Huang},
year = {2013},
doi = {10.1145/2491477.2491485},
url = {http://doi.acm.org/10.1145/2491477.2491485},
researchr = {https://researchr.org/publication/LeeH13-8},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {18},
number = {3},
pages = {41},
}