Seung Kyung Lee, Pilsung Kang, Sungzoon Cho. Probabilistic local reconstruction for k-NN regression and its application to virtual metrology in semiconductor manufacturing. Neurocomputing, 131:427-439, 2014. [doi]
@article{LeeKC14,
title = {Probabilistic local reconstruction for k-NN regression and its application to virtual metrology in semiconductor manufacturing},
author = {Seung Kyung Lee and Pilsung Kang and Sungzoon Cho},
year = {2014},
doi = {10.1016/j.neucom.2013.10.001},
url = {http://dx.doi.org/10.1016/j.neucom.2013.10.001},
researchr = {https://researchr.org/publication/LeeKC14},
cites = {0},
citedby = {0},
journal = {Neurocomputing},
volume = {131},
pages = {427-439},
}