A prognostic model for classification of COVID-19 severity based on clinical and laboratory testing data

Jae Bin Lee, Sang-Cheol Kim, Ju-Hee Lee, Hye-Yeong Jo. A prognostic model for classification of COVID-19 severity based on clinical and laboratory testing data. In Hyeran Byun, Beng Chin Ooi, Katsumi Tanaka, Sang-Won Lee 0001, Zhixu Li, Akiyo Nadamoto, Giltae Song, Young-Guk Ha, Kazutoshi Sumiya, Yuncheng Wu, Hyuk-Yoon Kwon, Takehiro Yamamoto, editors, IEEE International Conference on Big Data and Smart Computing, BigComp 2023, Jeju, Republic of Korea, February 13-16, 2023. pages 356-357, IEEE, 2023. [doi]

@inproceedings{LeeKLJ23-0,
  title = {A prognostic model for classification of COVID-19 severity based on clinical and laboratory testing data},
  author = {Jae Bin Lee and Sang-Cheol Kim and Ju-Hee Lee and Hye-Yeong Jo},
  year = {2023},
  doi = {10.1109/BigComp57234.2023.00081},
  url = {https://doi.org/10.1109/BigComp57234.2023.00081},
  researchr = {https://researchr.org/publication/LeeKLJ23-0},
  cites = {0},
  citedby = {0},
  pages = {356-357},
  booktitle = {IEEE International Conference on Big Data and Smart Computing, BigComp 2023, Jeju, Republic of Korea, February 13-16, 2023},
  editor = {Hyeran Byun and Beng Chin Ooi and Katsumi Tanaka and Sang-Won Lee 0001 and Zhixu Li and Akiyo Nadamoto and Giltae Song and Young-Guk Ha and Kazutoshi Sumiya and Yuncheng Wu and Hyuk-Yoon Kwon and Takehiro Yamamoto},
  publisher = {IEEE},
  isbn = {978-1-6654-7578-5},
}