In Soo Lee, J. T. Kim, J. W. Lee, Y.-J. Lee, K. Y. Kim. Neural Networks-based Fault Detection and Isolation of Nonlinear Systems. In Proceedings of the IASTED International Conference on Neural Networks and Computational Intelligence, NCI 2003, May 19-21, 2003, Cancun, Mexico. pages 142-147, IASTED/ACTA Press, 2003.
@inproceedings{LeeKLLK03:0,
title = {Neural Networks-based Fault Detection and Isolation of Nonlinear Systems},
author = {In Soo Lee and J. T. Kim and J. W. Lee and Y.-J. Lee and K. Y. Kim},
year = {2003},
tags = {rule-based},
researchr = {https://researchr.org/publication/LeeKLLK03%3A0},
cites = {0},
citedby = {0},
pages = {142-147},
booktitle = {Proceedings of the IASTED International Conference on Neural Networks and Computational Intelligence, NCI 2003, May 19-21, 2003, Cancun, Mexico},
publisher = {IASTED/ACTA Press},
}