Duk-Hyung Lee, Dong-Kone Kwak, Kyeong-Sik Min. Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, 45-nm, 32-nm Technology Nodes. JCP, 3(3):39-47, 2008. [doi]
@article{LeeKM08,
title = {Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, 45-nm, 32-nm Technology Nodes},
author = {Duk-Hyung Lee and Dong-Kone Kwak and Kyeong-Sik Min},
year = {2008},
url = {http://www.academypublisher.com/jcp/vol03/no03/jcp03033947.html},
researchr = {https://researchr.org/publication/LeeKM08},
cites = {0},
citedby = {0},
journal = {JCP},
volume = {3},
number = {3},
pages = {39-47},
}