Low Energy Signal Processing Techniques for Reliability Improvement of High-Density NAND Flash Memory

Dong-hwan Lee, Jonghong Kim, Wonyong Sung. Low Energy Signal Processing Techniques for Reliability Improvement of High-Density NAND Flash Memory. VLSI Signal Processing, 78(1):63-71, 2015. [doi]

Authors

Dong-hwan Lee

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Jonghong Kim

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Wonyong Sung

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