Jonathan Lee, Shin-Jie Lee. REAL: A Risk-Enabled reputation model for electronic commerce. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Singapore, 12-15 October 2008. pages 619-624, IEEE, 2008. [doi]
@inproceedings{LeeL08-8, title = {REAL: A Risk-Enabled reputation model for electronic commerce}, author = {Jonathan Lee and Shin-Jie Lee}, year = {2008}, doi = {10.1109/ICSMC.2008.4811346}, url = {http://dx.doi.org/10.1109/ICSMC.2008.4811346}, researchr = {https://researchr.org/publication/LeeL08-8}, cites = {0}, citedby = {0}, pages = {619-624}, booktitle = {Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Singapore, 12-15 October 2008}, publisher = {IEEE}, isbn = {978-1-4244-2383-5}, }