SeokYeong Lee, Seungkyu Lee. Surface IR Reflectance Estimation and Material Recognition using ToF Camera. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 6463-6470, IEEE, 2020. [doi]
@inproceedings{LeeL20-41,
title = {Surface IR Reflectance Estimation and Material Recognition using ToF Camera},
author = {SeokYeong Lee and Seungkyu Lee},
year = {2020},
doi = {10.1109/ICPR48806.2021.9412450},
url = {https://doi.org/10.1109/ICPR48806.2021.9412450},
researchr = {https://researchr.org/publication/LeeL20-41},
cites = {0},
citedby = {0},
pages = {6463-6470},
booktitle = {25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021},
publisher = {IEEE},
isbn = {978-1-7281-8808-9},
}