Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time - researchr publication authors

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Hye-Hyun Lee, Kang-Yoon Lee. Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time. In Fourteenth International Conference on Ubiquitous and Future Networks, ICUFN 2023, Paris, France, July 4-7, 2023. pages 894-897, IEEE, 2023. [doi]

This author has not been identified. Look up 'Hye-Hyun Lee' in GoogleThis author has not been identified. Look up 'Kang-Yoon Lee' in Google

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