Depth Measurement Using Frequency Analysis with an Active Projection

Sang-Keun Lee, Sun-Ho Lee, Jong-Soo Choi. Depth Measurement Using Frequency Analysis with an Active Projection. In ICIP (2). pages 906-909, 1999.

Authors

Sang-Keun Lee

This author has not been identified. Look up 'Sang-Keun Lee' in Google

Sun-Ho Lee

This author has not been identified. Look up 'Sun-Ho Lee' in Google

Jong-Soo Choi

This author has not been identified. Look up 'Jong-Soo Choi' in Google