Kwangsun Lee, HoJoon Lee, Jihyun Lee, Hyunchul Sagong. Analytical Extraction of Thermal Resistance in Power Semiconductors Using Structural Function Derivatives and Series Resistance Modeling. IEEE Access, 14:20077-20083, 2026. [doi]
@article{LeeLLS26,
title = {Analytical Extraction of Thermal Resistance in Power Semiconductors Using Structural Function Derivatives and Series Resistance Modeling},
author = {Kwangsun Lee and HoJoon Lee and Jihyun Lee and Hyunchul Sagong},
year = {2026},
doi = {10.1109/ACCESS.2026.3660730},
url = {https://doi.org/10.1109/ACCESS.2026.3660730},
researchr = {https://researchr.org/publication/LeeLLS26},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {14},
pages = {20077-20083},
}