A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing

Kuen-Jong Lee, Ching-An Liu, Chia-Chi Wu. A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing. IEEE Trans. Emerging Topics Comput., 10(1):373-385, 2022. [doi]

Authors

Kuen-Jong Lee

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Ching-An Liu

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Chia-Chi Wu

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