Jang Hee Lee, Jae Whan Park. Adaptive burn-in time decision system based on pattern recognition for intelligent reliability control. Expert Syst. Appl., 35(4):1688-1697, 2008. [doi]
@article{LeeP08:5,
title = {Adaptive burn-in time decision system based on pattern recognition for intelligent reliability control},
author = {Jang Hee Lee and Jae Whan Park},
year = {2008},
doi = {10.1016/j.eswa.2007.08.079},
url = {http://dx.doi.org/10.1016/j.eswa.2007.08.079},
tags = {control systems, rule-based, reliability},
researchr = {https://researchr.org/publication/LeeP08%3A5},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {35},
number = {4},
pages = {1688-1697},
}