Automatic test case generation using multi-protocol test method - researchr publication authors

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Soo-in Lee, Yongbum Park, Myungchul Kim, Hee Yong Youn, Ben Lee. Automatic test case generation using multi-protocol test method. In Ton Engbersen, E. K. Park, editors, Proceedings Ninth International Conference on Computer Communications and Networks, ICCCN 2000, 16-18 October 2000, Las Vegas, Nevada, USA. pages 360-366, IEEE, 2000. [doi]

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