Chang-Kyo Lee, Seung-Tak Ryu. Noise analysis of replica driving technique and its verification to 12-bit 200 MS/s pipelined ADC. IET Circuits, Devices & Systems, 13(8):1277-1283, 2019. [doi]
@article{LeeR19-2,
title = {Noise analysis of replica driving technique and its verification to 12-bit 200 MS/s pipelined ADC},
author = {Chang-Kyo Lee and Seung-Tak Ryu},
year = {2019},
doi = {10.1049/iet-cds.2018.5308},
url = {https://doi.org/10.1049/iet-cds.2018.5308},
researchr = {https://researchr.org/publication/LeeR19-2},
cites = {0},
citedby = {0},
journal = {IET Circuits, Devices & Systems},
volume = {13},
number = {8},
pages = {1277-1283},
}