Risk Identification Questionnaire for Detecting Unintended Bias in the Machine Learning Development Lifecycle

Michelle Seng Ah Lee, Jatinder Singh. Risk Identification Questionnaire for Detecting Unintended Bias in the Machine Learning Development Lifecycle. In Marion Fourcade, Benjamin Kuipers, Seth Lazar, Deirdre K. Mulligan, editors, AIES '21: AAAI/ACM Conference on AI, Ethics, and Society, Virtual Event, USA, May 19-21, 2021. pages 704-714, ACM, 2021. [doi]

@inproceedings{LeeS21-14,
  title = {Risk Identification Questionnaire for Detecting Unintended Bias in the Machine Learning Development Lifecycle},
  author = {Michelle Seng Ah Lee and Jatinder Singh},
  year = {2021},
  doi = {10.1145/3461702.3462572},
  url = {https://doi.org/10.1145/3461702.3462572},
  researchr = {https://researchr.org/publication/LeeS21-14},
  cites = {0},
  citedby = {0},
  pages = {704-714},
  booktitle = {AIES '21: AAAI/ACM Conference on AI, Ethics, and Society, Virtual Event, USA, May 19-21, 2021},
  editor = {Marion Fourcade and Benjamin Kuipers and Seth Lazar and Deirdre K. Mulligan},
  publisher = {ACM},
  isbn = {978-1-4503-8473-5},
}