M. H. C. Lee, D. L. Tao. A testability measure for hierarchical design environments. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 303-307, IEEE Computer Society, 1995. [doi]
@inproceedings{LeeT95-2,
title = {A testability measure for hierarchical design environments},
author = {M. H. C. Lee and D. L. Tao},
year = {1995},
doi = {10.1109/EDTC.1995.470380},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470380},
researchr = {https://researchr.org/publication/LeeT95-2},
cites = {0},
citedby = {0},
pages = {303-307},
booktitle = {1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7039-8},
}