C. C. Lee, K.-K. Wong, W. C. Cheng, S. P. Li, H. C. Li. Smart Control System on Electrical Safety in Testing Laboratories. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 3031-3036, IEEE, 2019. [doi]
@inproceedings{LeeWCLL19,
title = {Smart Control System on Electrical Safety in Testing Laboratories},
author = {C. C. Lee and K.-K. Wong and W. C. Cheng and S. P. Li and H. C. Li},
year = {2019},
doi = {10.1109/IECON.2019.8927824},
url = {https://doi.org/10.1109/IECON.2019.8927824},
researchr = {https://researchr.org/publication/LeeWCLL19},
cites = {0},
citedby = {0},
pages = {3031-3036},
booktitle = {IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4878-6},
}