Chul-Ho Lee, Xin Xu, Do Young Eun. Beyond random walk and metropolis-hastings samplers: why you should not backtrack for unbiased graph sampling. In Peter G. Harrison, Martin F. Arlitt, Giuliano Casale, editors, ACM SIGMETRICS/PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '12, London, United Kingdom, June 11-15, 2012. pages 319-330, ACM, 2012. [doi]
@inproceedings{LeeXE12,
title = {Beyond random walk and metropolis-hastings samplers: why you should not backtrack for unbiased graph sampling},
author = {Chul-Ho Lee and Xin Xu and Do Young Eun},
year = {2012},
doi = {10.1145/2254756.2254795},
url = {http://doi.acm.org/10.1145/2254756.2254795},
researchr = {https://researchr.org/publication/LeeXE12},
cites = {0},
citedby = {0},
pages = {319-330},
booktitle = {ACM SIGMETRICS/PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '12, London, United Kingdom, June 11-15, 2012},
editor = {Peter G. Harrison and Martin F. Arlitt and Giuliano Casale},
publisher = {ACM},
isbn = {978-1-4503-1097-0},
}