Janghee Lee, Suk I. Yoo. Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm. J. Electronic Imaging, 21(3):33014, 2012. [doi]
@article{LeeY12-18,
title = {Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm},
author = {Janghee Lee and Suk I. Yoo},
year = {2012},
doi = {10.1117/1.JEI.21.3.033014},
url = {http://dx.doi.org/10.1117/1.JEI.21.3.033014},
researchr = {https://researchr.org/publication/LeeY12-18},
cites = {0},
citedby = {0},
journal = {J. Electronic Imaging},
volume = {21},
number = {3},
pages = {33014},
}