Simultaneous Fault Models for the Generation of Efficient Error Detection Mechanisms - researchr publication authors

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Matthew Leeke. Simultaneous Fault Models for the Generation of Efficient Error Detection Mechanisms. In 28th IEEE International Symposium on Software Reliability Engineering, ISSRE 2017, Toulouse, France, October 23-26, 2017. pages 112-123, IEEE Computer Society, 2017. [doi]

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