ShaoChong Lei, Feng Liang, Zeye Liu, Xiaoying Wang, Zhen Wang. A Low Power Test Pattern Generator for BIST. IEICE Transactions, 93-C(5):696-702, 2010. [doi]
@article{LeiLLWW10,
title = {A Low Power Test Pattern Generator for BIST},
author = {ShaoChong Lei and Feng Liang and Zeye Liu and Xiaoying Wang and Zhen Wang},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-c_5_696},
tags = {testing},
researchr = {https://researchr.org/publication/LeiLLWW10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-C},
number = {5},
pages = {696-702},
}