Generic Reliability Analysis for Safety-Critical FlexRay Drive-By-Wire Systems

Kuen-Long Leu, Jwu-E Chen, Chin-Long Wey, Yung-Yuan Chen. Generic Reliability Analysis for Safety-Critical FlexRay Drive-By-Wire Systems. In 2012 International Conference on Connected Vehicles and Expo, ICCVE 2012, Beijing, China, December 12-16, 2012. pages 216-221, IEEE Computer Society, 2012. [doi]

@inproceedings{LeuCWC12,
  title = {Generic Reliability Analysis for Safety-Critical FlexRay Drive-By-Wire Systems},
  author = {Kuen-Long Leu and Jwu-E Chen and Chin-Long Wey and Yung-Yuan Chen},
  year = {2012},
  doi = {10.1109/ICCVE.2012.48},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICCVE.2012.48},
  researchr = {https://researchr.org/publication/LeuCWC12},
  cites = {0},
  citedby = {0},
  pages = {216-221},
  booktitle = {2012 International Conference on Connected Vehicles and Expo, ICCVE 2012, Beijing, China, December 12-16, 2012},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-4705-1},
}