Interval Analysis in Dioid: Application to Robust Open-Loop Control for Timed Event Graphs

Mehdi Lhommeau, Laurent Hardouin, Jean-Louis Ferrier, Iteb Ouerghi. Interval Analysis in Dioid: Application to Robust Open-Loop Control for Timed Event Graphs. In 44th IEEE IEEE Conference on Decision and Control and 8th European Control Conference Control, CDC/ECC 2005, Seville, Spain, 12-15 December, 2005. pages 7744-7749, IEEE, 2005. [doi]

Authors

Mehdi Lhommeau

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Laurent Hardouin

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Jean-Louis Ferrier

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Iteb Ouerghi

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